Electrical contact resistances of thermoelectric thin films measured by Kelvin probe microscopy
Authors: Munoz-Rojo, M; Caballero-Calero, O; Martin-Gonzalez, M Article. Appl. Phys. Lett.. vol: 103. page: 0003-6951. Date: oct-28. 2013. Doi: 10.1063/1.4826684. Abstract: This work presents an approach for measuring cross plane electrical contact resistances directly using Kelvin Probe Microscopy. With this technique we were able to measure the electrical contact resistances of a cross section of a