EQUIPMENT

Others

Different facilities for specific characterization (as densitiy measurements) are also available, as well as all the facilities offered by MINA y SIdI-UAM. (poner enlaces a MINA y SIdI-UAM).

Density measurement

Density determination of solids by Archimedes method with a XSE105DU analytical balance from Mettler Toledo.

Growth and Fabrication

ELECTROCHEMICAL DEPOSITION

POROUS ALUMINA TEMPLATE FABRICATION

SPUTTERING

THERMAL TREATMENTS

ULTRA-HIGH-VACUUM DEPOSITION

UHV DEPOSITION SYSTEM

3D PRINTER

Morphological characterization

AFM

Spectroscopies

RAMAN

INFRARED SPECTROSCOPY

Electrical Characterization

HALL MEASUREMENTS

THERMOELECTRIC POWER FACTOR MEASUREMENT

Thermal Characterization

THERMAL CONDUCTIVITY

Magnetic Chatacterization

FTIR SPECTROMETER WITH IR MICROSCOPE AND ATR OBJECTIVE

PHOTOCURRENT/PHOTOVOLTAGE MEASUREMENTS

TRANSVERSE LONGITUDINAL KERR