EQUIPMENT

Morphological Characterization

Apart from the groups facilities, which include an optical microscope and atomic force microscope, we have access to the facilities of the IMN (Bruker DRX, high-resolution SEM, etc.)

AFM

Scanning Probe Microscopy (SPM) is a powerful technique that allows studying the surface of materials at nanometer scale.

Growth and Fabrication

ELECTROCHEMICAL DEPOSITION

POROUS ALUMINA TEMPLATE FABRICATION

SPUTTERING

THERMAL TREATMENTS

ULTRA-HIGH-VACUUM DEPOSITION

UHV DEPOSITION SYSTEM

3D PRINTER

Spectroscopies

RAMAN

INFRARED SPECTROSCOPY

Electrical Characterization

HALL MEASUREMENTS

THERMOELECTRIC POWER FACTOR MEASUREMENT

Thermal Characterization

THERMAL CONDUCTIVITY

Magnetic Chatacterization

FTIR SPECTROMETER WITH IR MICROSCOPE AND ATR OBJECTIVE

PHOTOCURRENT/PHOTOVOLTAGE MEASUREMENTS

TRANSVERSE LONGITUDINAL KERR

Others

DENSITY MEASUREMENT